The purchase of equipment for the college subsidized loan project, X-ray photoelectron spectroscopy analyzer (XPS), has been installed and debugged. It is planned to open a free trial run for teachers and students from May 26, 2025, with a trial run period of two weeks. To ensure that more users have the opportunity to try out, each teacher is limited to 5 samples. You can use the school's large instrument sharing platform or contact the experimental center to open appointments both online and offline.
Model: Shimadzu KRATOS AXIS SUPRA+
Introduction: Mainly used for chemical information of solid surfaces and interfaces, it can analyze the types and valence states of elements other than hydrogen and helium, and determine the semi quantitative analysis of element relative content. The combination of XPS imaging function and ion sputtering etching can be used for the surface distribution and depth analysis of solid surface element composition and valence states. Simultaneously possessing high-performance XPS analysis, fast parallel chemical imaging analysis, and small beam spot micro area analysis.
Sample basic requirements: The sample does not contain elemental sulfur, iodine, fluorine, or bromine. Non magnetic, volatile, toxic, and radioactive.
